Measurement of exo-electron emission from MgO thin film of ACPDPs

초록

Exo-electron emission from MgO thin film was measured by attaching a high-precision current sensor to the address electrode of the rear plate of an ACPDP test panel. The measured results revealed that the exo-electron emission currents can vary very sensitively with the type of doping elements used in MgO film and the measuring temperature. The activation energy of the exo-electron emission estimated from the emission curves indicated that the trap levels are between 0.05 and 0.32 eV below the bottom of its conduction band. This suggests that shallow electron-trap levels within MgO film are mainly responsible for the exo-electron emission.

키워드