Wall charge holding characteristics of doped MgO thin film for ac-PDP

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초록

Wall voltage holding characteristics of doped MgO were evaluated using VT close curve measurement. The results revealed that the holding characteristics are poor with the doped film. The causes of such poor characteristics were examined using FTIR measurements. The results indicated that shallow defects levels formed by doping may be responsible for such poor wall voltage holding characteristics.

제목
Wall charge holding characteristics of doped MgO thin film for ac-PDP
저자
Yoon, S.-H.; Yang, H.-S.; Kim, Y.-S.
발행일
2007
유형
Conference Paper
저널명
IDW '07 - Proceedings of the 14th International Display Workshops
권
2
페이지
811 ~ 812