New power-efficient flip-flop based on a true single-phase clock and robust to single-node upsets

Citations

SCOPUS

2

초록

As the size of technology shrinks, its immunity to the space radiation environment decreases. A single-event transient (SET) induced by radiation can cause permanent damage to devices. Therefore, engineers have been researching radiation-hardened flip-flops or latches that are robust to soft errors. This paper proposes a true-single-phase-clock (TSPC)-based single-node-upset (SNU)-tolerant flip-flop, which is robust to SNUs and even faster than conventional DFFs. This flip-flop consists of two modules of TSPC flip-flops, except for inverters, and a Muller C-element. It has only 22 transistors, which makes it area-efficient. Moreover, the proposed flip-flop uses a TSPC; hence, the clock-to-Q delay is 10% less than the conventional DFF. © 2021 Institute of Electronics and Information Engineers. All rights reserved.

키워드

Fast; Power-efficient; Radiation-hardened by design (RHBD); Single-event transient (SET); Single-event upset (SEU); Single-node upset (SNU); True single-phase clock (TSPC)
제목
New power-efficient flip-flop based on a true single-phase clock and robust to single-node upsets
저자
Song, S.; Kim, Y.
DOI
10.5573/IEIESPC.2021.10.2.167
발행일
2021
유형
Article
저널명
IEIE Transactions on Smart Processing & Computing
권
10
호
2
페이지
167 ~ 175