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New power-efficient flip-flop based on a true single-phase clock and robust to single-node upsets
- Song, S.;
- Kim, Y.
SCOPUS
2초록
As the size of technology shrinks, its immunity to the space radiation environment decreases. A single-event transient (SET) induced by radiation can cause permanent damage to devices. Therefore, engineers have been researching radiation-hardened flip-flops or latches that are robust to soft errors. This paper proposes a true-single-phase-clock (TSPC)-based single-node-upset (SNU)-tolerant flip-flop, which is robust to SNUs and even faster than conventional DFFs. This flip-flop consists of two modules of TSPC flip-flops, except for inverters, and a Muller C-element. It has only 22 transistors, which makes it area-efficient. Moreover, the proposed flip-flop uses a TSPC; hence, the clock-to-Q delay is 10% less than the conventional DFF. © 2021 Institute of Electronics and Information Engineers. All rights reserved.
키워드
- 제목
- New power-efficient flip-flop based on a true single-phase clock and robust to single-node upsets
- 저자
- Song, S.; Kim, Y.
- 발행일
- 2021
- 유형
- Article
- 권
- 10
- 호
- 2
- 페이지
- 167 ~ 175
- 언어
- ENG
- 출판사
- Institute of Electronics Engineers of Korea
- 발행국가
- 대한민국
- 분량
- 9 페이지
- ISSN
- P 2287-5255