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Subthreshold slope as a measure of interfacial trap density in pentacene films
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16SCOPUS
17초록
Electrical properties in organic field effect transistors (FETs) are dominated by charge transport in the accumulation layer, few molecular layers close to the gate dielectric. Through comparison of the subthreshold slope between monolayer (ML) and thick pentacene FETs, formation of the second layer islands on top of the complete first layer is found to be crucial in determining the charge transport in ML pentacene FETs. It is demonstrated that a pentacene ML field effect transistor (FET) is an excellent probe that can detect electronic states of organic semiconductors interfacing with the gate dielectric at nanometer scale. Far higher sub-threshold slope in ML FETs, as a measure of interfacial charge trap density, than that in thick pentacene FETs is translated that the path of the induced carriers in ML FETs is limited into the molecular layer interfacing with the gate dielectric with a high density of charge traps, while carriers in thicker films have alternative pathways through more electrically conductive layer above the first layer with much less trap density. (C) 2016 Elsevier B.V. All rights reserved.
키워드
- 제목
- Subthreshold slope as a measure of interfacial trap density in pentacene films
- 저자
- Kwon, Yongwoo; Park, Byoungnam
- 발행일
- 2016-01-29
- 유형
- Article
- 저널명
- Thin Solid Films
- 권
- 599
- 페이지
- 145 ~ 150
- 언어
- ENG
- 출판사
- ELSEVIER SCIENCE SA
- 발행국가
- 스위스
- 분량
- 6 페이지
- ISSN
- P 0040-6090