Minimal Aliasing Single-Error-Correction Codes for DRAM Reliability Improvement

Pae, Sung-il; Kozhikkottu, V.; Somasekar, D.; Wu, W.; Ramasubramanian, S.G.; Dadual, M.; Cho, H.; Kwon, Konwoo

doi:10.1109/ACCESS.2021.3059843

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Minimal Aliasing Single-Error-Correction Codes for DRAM Reliability Improvement

Pae, Sung-il;
Kozhikkottu, V.;
Somasekar, D.;
Wu, W.;
Ramasubramanian, S.G.;
... Kwon, Konwoo;
외 2명

Citations

WEB OF SCIENCE

9

Citations

SCOPUS

12

초록

We discuss the problem of finding a minimal aliasing code among a class of systematic single-error-correction codes that are suitable to be implemented within DRAM die, as opposed to external ECC used in memory controller outside of DRAM chip. We prove a sharp lower bound of aliasing probability and propose a simple method to come up with a code that meets the bound. By an experiment, we also demonstrate that a randomly chosen code is likely to have much more aliasings with overwhelmingly high probability. ? 2013 IEEE.

키워드

In-DRAM error correcting code; minimal aliasing code; single error correction; Error correction; Aliasing; DRAM chips; High probability; Lower bounds; Memory controller; Reliability improvement; SIMPLE method; Single error corrections; Dynamic random access storage

제목: Minimal Aliasing Single-Error-Correction Codes for DRAM Reliability Improvement

저자: Pae, Sung-il; Kozhikkottu, V.; Somasekar, D.; Wu, W.; Ramasubramanian, S.G.; Dadual, M.; Cho, H.; Kwon, Konwoo

DOI: 10.1109/ACCESS.2021.3059843

발행일: 2021

유형: Article

저널명: IEEE Access

권: 9

페이지: 29862 ~ 29869

언어: ENG

출판사: Institute of Electrical and Electronics Engineers Inc.

발행국가: 미국

분량: 8 페이지

ISSN: P 2169-3536