Relationship between exo-electron currents from MgO thin film and statistical delay time in ACPDPs

초록

The exo-electron currents from a ACPDP test panel with or without MgO crystals sprayed on MgO film were measured directly after eliminating of the wall-voltage effect. An inverse relationship was established between the statistical delay time and exo-electron current from the MgO cathode film. The spraying of MgO crystals on MgO thin film was observed to reduce the statistical delay time dramatically even for the same exo-electron currents measured. The shift of the inverse curve may be attributed to an increased discharge success probability by the MgO crystals sprayed.

키워드