Heteroepitaxial InP growth on a Si(001) substrate using a Ge buffer layer in MOCVD

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초록

In this study, we grew InP heteroepitaxial layers on Si(001) substrates with Ge buffer layers. We found out that surface of InP layer was smoothened by adjusting Ge buffer layer. In addition, the suppression of planar defects in InP leaded to the improved crystallinity and optical properties, in spite of the increased threading dislocations. Our study suggested the possibility of combination of III-V and Ge for the future CMOS technologies. © 2023 IEEE.

키워드

Heteroepitaxy; InP and germanium
제목
Heteroepitaxial InP growth on a Si(001) substrate using a Ge buffer layer in MOCVD
저자
Shin, Keun Wook; Lee, Sang-Moon; Lee, Kiyoung; Yoon, Euijoon
DOI
10.1109/EDTM55494.2023.10102975
발행일
2023-01-01
유형
Proceedings Paper
저널명
7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023