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Microelectronic Engineering
ISSN
P 0167-9317 E 1873-5568
출판사
Elsevier BV
국가
NETHERLANDS
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
JCR 1997-2025 (29년)
SCI 2010-2019 (10년)
SCIE 2010-2026 (17년)
Scopus 1983-2026 (44년)
SJR 1999-2020, 2022-2025 (26년)
전체 7건 중 1번부터 7번까지의 결과를 표시합니다.
2024
Article
An Effective Algorithm of Outlier Correction in Space-time Radar Rainfall Data Based on the Iterative Localized Analysis
- Kim, Yongchan ;
- Kim, Dongkyun ;
- Park, Jeongha ;
- Jun, Changhyun
- 2024
- IEEE Transactions on Geoscience and Remote Sensing
- Institute of Electrical and Electronics Engineers Inc.
2023
Article
Understanding the Way Machines Simulate Hydrological Processes - A Case Study of Predicting Fine-scale Watershed Response on a Distributed Framework
- 2023
- IEEE Transactions on Geoscience and Remote Sensing
- Institute of Electrical and Electronics Engineers Inc.
2018
Article
Polarimetric Radar Vegetation Index for Biomass Estimation in Desert Fringe Ecosystems
- Chang, Jisung Geba ;
- Shoshany, Maxim ;
- Oh, Yisok
- 2018-12
- IEEE Transactions on Geoscience and Remote Sensing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2015
Article
A Modified Water-Cloud Model With Leaf Angle Parameters for Microwave Backscattering From Agricultural Fields
- Kweon, Soon-Koo ;
- Oh, Yisok
- 2015-05
- IEEE Transactions on Geoscience and Remote Sensing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2014
Article
Estimation of Soil Moisture and Surface Roughness From Single-Polarized Radar Data for Bare Soil Surface and Comparison With Dual- and Quad-Polarization Cases
- Kweon, Soon-Koo ;
- Oh, Yisok
- 2014-07
- IEEE Transactions on Geoscience and Remote Sensing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2009
Article
Polarimetric Backscattering Coefficients of Flooded Rice Fields at L- and C-Bands: Measurements, Modeling, and Data Analysis
- Oh, Yisok ;
- Hong, Suk-Young ;
- Kim, Yunjin ;
- Hong, Jin-Young ;
- Kim, Yi-Hyun
- 2009-08
- IEEE Transactions on Geoscience and Remote Sensing
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
1998
Article
Condition for precise measurement of soil surface roughness
- Oh, Y. ;
- Kay, Y.C.
- 1998
- IEEE Transactions on Geoscience and Remote Sensing