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IEEE Electron Device Letters
ISSN
P 0741-3106 E 1558-0563
출판사
Institute of Electrical and Electronics Engineers
국가
USA
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
JCR 1997-2025 (29년)
SCI 2010-2019 (10년)
SCIE 2010-2026 (17년)
Scopus 1980-2026 (47년)
SJR 1999-2020, 2022-2025 (26년)
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2025
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Article
Interface percolation and random trap generation in ferroelectric memory: A two-step degradation mechanism explored through low-frequency noise spectroscopy
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- 외 7명
- 2025-10
- Chaos, Solitons & Fractals
- Elsevier Ltd
Article
Stochastic behavior of random telegraph noise in ferroelectric devices: Impact of downscaling and mitigation strategies for neuromorphic applications
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- 이성태 ;
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- 2025-02
- Chaos, Solitons & Fractals
- PERGAMON-ELSEVIER SCIENCE LTD
2023
Article
Exploring the relationship between the spatial distribution of roads and universal pattern of travel-route efficiency in urban road networks
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- Cheon, S. ;
- Son, S.-W. ;
- Lee, M.J. ;
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- 2023-09
- Chaos, Solitons & Fractals
- Elsevier Ltd