상세 보기
SAGE Open
ISSN
P 2158-2440
출판사
SAGE Publications Inc.
국가
USA
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2012-2025 (14년)
DOAJ 2017-2025 (9년)
ESCI 2016-2018 (3년)
JCR 2018-2025 (8년)
Scopus 2011-2026 (16년)
SJR 2000-2002, 2012-2020, 2022-2025 (16년)
SSCI 2018-2026 (9년)
전체 59건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Image Lookup Table Compression Using Scaled Partitioning with Memory Data Compression
- Lee, Jeonghun ;
- Lim, Sanghyun ;
- Youn, Seongjo ;
- You, Jaehee
- 2026-02
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Institute of Electronics Engineers of Korea
Article
Analysis of Non-ideal Ohmic Characteristics in Mg-incorporated P-type GaN Contacts
- Kim, Nak Hyeon ;
- Kim, Min-Jeoung ;
- Cha, Ho-Young
- 2026
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Institute of Electronics Engineers of Korea
2025
Article
Sensing Characteristics and Transduction Mechanism of WO3-based Si FET-type Humidity Sensor Using Pulse Measurement
- Hong, Yoonki ;
- Yun, Jonghyun ;
- Han, Dong Jin ;
- Lee, Sung-Tae ;
- Woo, Sung Yun
- 2025-06
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
p-GaN/AlGaN/GaN Micro-LED Integrated with Monolithic Driving IC
- Oh, Hee-Jae ;
- Oh, Dong-Ik ;
- Kim, Hyun-Seop ;
- Cha, Ho-Young
- 2025-04
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
Analysis of Channel Thermal Resistance in AlGaN/GaN High Electron Mobility Transistors-on SiC with Different Buffer Thickness
- Lee, Junpyo ;
- Min, Byoung-Gue ;
- Lee, Jongmin ;
- Kang, Dongmin ;
- Kim, Hyungtak
- 2025-04
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
2024
Article
Image Data Compression and Decompression Unit Considering Brightness Sensitivity
- Lim, Sanghyun ;
- Cho, Donghun ;
- You, Jaehee
- 2024-10
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
Article
A More Practical Indicator of MAC Operational Power Efficiency inside Memory-based Synapse Array
- Cho, Seongjae ;
- Lee, Sung-Tae ;
- Kim, Soomin ;
- Shin, Hyungcheol
- 2024-02
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- 대한전자공학회
2023
Article
Time-and Temperature-dependent Degradation of p-GaN Gate HEMTs under Forward Gate Voltage Stress
- Chae, Myeongsu ;
- Kim, Hyungtak
- 2023-12
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Institute of Electronics Engineers of Korea
Article
Security Problems of Latest FPGAs and Reverse Engineering Methods of Xilinx 7-series FPGAs
- Lee, Dongchan ;
- Lee, Sanghyun ;
- Cho, Mannhee ;
- Lee, Hyung-Min ;
- Kim, Youngmin
- 2023-10
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Institute of Electronics Engineers of Korea
Article
Lossless LUT Compressions for Image Enhancement
- Kim, Sunmyung ;
- You, Jaehee
- 2023-06
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- IEEK PUBLICATION CENTER
1