SAGE Open

ISSN
P 2158-2440
출판사
SAGE Publications Inc.
국가
USA
발행 상태
활성

데이터베이스 수록 정보

CiteScore 2012-2025 (14년)
DOAJ 2017-2025 (9년)
ESCI 2016-2018 (3년)
JCR 2018-2025 (8년)
Scopus 2011-2026 (16년)
SJR 2000-2002, 2012-2020, 2022-2025 (16년)
SSCI 2018-2026 (9년)

전체 59건 중 1번부터 10번까지의 결과를 표시합니다.

2026
Article

Image Lookup Table Compression Using Scaled Partitioning with Memory Data Compression

  • Lee, Jeonghun
  • Lim, Sanghyun
  • Youn, Seongjo
  • You, Jaehee
  • 2026-02
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • Institute of Electronics Engineers of Korea
Article

Analysis of Non-ideal Ohmic Characteristics in Mg-incorporated P-type GaN Contacts

  • 2026
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • Institute of Electronics Engineers of Korea
2025
Article

Sensing Characteristics and Transduction Mechanism of WO3-based Si FET-type Humidity Sensor Using Pulse Measurement

  • Hong, Yoonki
  • Yun, Jonghyun
  • Han, Dong Jin
  • Lee, Sung-Tae
  • Woo, Sung Yun
  • 2025-06
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

p-GaN/AlGaN/GaN Micro-LED Integrated with Monolithic Driving IC

  • 2025-04
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

Analysis of Channel Thermal Resistance in AlGaN/GaN High Electron Mobility Transistors-on SiC with Different Buffer Thickness

  • Lee, Junpyo
  • Min, Byoung-Gue
  • Lee, Jongmin
  • Kang, Dongmin
  • Kim, Hyungtak
  • 2025-04
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
2024
Article

Image Data Compression and Decompression Unit Considering Brightness Sensitivity

  • 2024-10
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

A More Practical Indicator of MAC Operational Power Efficiency inside Memory-based Synapse Array

  • Cho, Seongjae
  • Lee, Sung-Tae
  • Kim, Soomin
  • Shin, Hyungcheol
  • 2024-02
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • 대한전자공학회
2023
Article

Time-and Temperature-dependent Degradation of p-GaN Gate HEMTs under Forward Gate Voltage Stress

  • 2023-12
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • Institute of Electronics Engineers of Korea
Article

Security Problems of Latest FPGAs and Reverse Engineering Methods of Xilinx 7-series FPGAs

  • Lee, Dongchan
  • Lee, Sanghyun
  • Cho, Mannhee
  • Lee, Hyung-Min
  • Kim, Youngmin
  • 2023-10
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • Institute of Electronics Engineers of Korea
Article

Lossless LUT Compressions for Image Enhancement

  • 2023-06
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
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