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SAGE Open

ISSN

P 2158-2440

출판사

SAGE Publications Inc.

국가

USA

발행 상태

활성

데이터베이스 수록 정보

CiteScore 2012-2025 (14년)

DOAJ 2017-2025 (9년)

ESCI 2016-2018 (3년)

JCR 2018-2025 (8년)

Scopus 2011-2026 (16년)

SJR 2000-2002, 2012-2020, 2022-2025 (16년)

SSCI 2018-2026 (9년)

전체 12건 중 1번부터 10번까지의 결과를 표시합니다.

2025

Article

Theoretical Evaluation of Reliability and Via Resistance of Liner-Less Co Interconnect Using Co-Ti Binary Alloy

Park, Shinyeong ;
Kang, Seongwoo ;
Kim, Gayun ;
Moon, Joonho ;
Lee, Kiyoung ;
외 1명

2025-09-05
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Comparative Analysis of Grain Boundary Effects in FET-Type and Diode-Type 3-D NAND Flash Memory

Kim, Jinsu ;
Kim, Hansol ;
Im, Jisung ;
Lee, Sung-Tae ;
Kwon, Dongseok ;
외 2명

2025-09-01
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Quantitative Analysis of Trap Behaviors for Deuterium Annealing Effect on IGZO TFTs by TCAD and Experimental Characterization

Song, Hyeonjun ;
Yoon, Soon Joo ;
Yoo, Jaewook ;
Lim, Seongbin ;
Ku, Ja-Yun ;
... Lee, Kiyoung ;
외 10명

2025-03
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2023

Article

Effects of Sensor Platform Scaling on Signal-to-Noise Ratio in the Resistor-and Horizontal Floating-Gate FET-Type Gas Sensors

Shin, Wonjun ;
Koo, Ryun-Han ;
Hong, Seongbin ;
Jung, Gyuweon ;
Jeong, Yujeong ;
... Lee, Sung-Tae ;
외 1명

2023-11
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers Inc.

Article

Annealing Ambient and Film Thickness Dependent NO<inline-formula> <tex-math notation=LaTeX>$_{\text{2}}$</tex-math> </inline-formula> Response and 1/<italic>f</italic> Noise Characteristics of IGZO Resistor-Type Gas Sensors

Shin, Wonjun ;
Koo, Ryun-Han ;
Hong, Seongbin ;
Jeong, Yujeong ;
Jung, Gyuweon ;
... Lee, Sung-Tae ;
외 1명

2023-10-01
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers Inc.

Article

Neuromorphic Computing Using Random Synaptic Feedback Weights for Error Backpropagation in NAND Flash Memory-Based Synaptic Devices

Lee, S.-T. ;
Lee, J.-H.

2023-03-01
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers Inc.

2017

Article

Exo-Electron Emission From MgO Nanopowders on MgO Thin Film of Alternating Current Plasma Display Panels-Part II. Relationship Between Exo-Electron Currents and Statistical Delay

Kim, Joong Kyun ;
Kim, Yong-Seog ;
Weber, Larry F.

2017-08
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Exo-Electron Emission From MgO Nanopowders on MgO Thin Film of Alternating Current Plasma Display Panels-Part I. Mechanism of Exo-Electron Emission

Kim, Yong-Seog ;
Kim, Joong Kyun ;
Weber, Larry F.

2017-08
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2012

Article

Amorphous InGaZnO Thin-Film Transistors-Part I: Complete Extraction of Density of States Over the Full Subband-Gap Energy Range

Kim, Yongsik ;
Bae, Minkyung ;
Kim, Woojoon ;
Kong, Dongsik ;
Jeong, Hyun Kwang ;
... Kim, Hyungtak ;
외 3명

2012-10
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

2010

Article

Intrinsic Capacitance Characteristics of Top-Contact Organic Thin-Film Transistors

Kim, Kangmin ;
Kim, Youngmin

2010-09
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC