권용우 프로필 사진

권용우

Kwon, Yong woo

공과대학

신소재화공시스템공학부 신소재공학전공

자료 필터

자료유형

발행연도

2013 ~ 2026
2013 2026

키워드

언어

전체 37건 중 21번부터 30번까지의 결과를 표시합니다.

2017
Article

Enhanced Endurance Organolead Halide Perovskite Resistive Switching Memories Operable under an Extremely Low Bending Radius

  • Choi, Jaeho ; 
  • Quyet Van Le ; 
  • Hong, Kootak ; 
  • Moon, Cheon Woo ; 
  • Han, Ji Su ; 
  • ... Kwon, Yongwoo ; 
  • 외 4명
  • 2017-09-13
  • ACS Applied Materials & Interfaces
  • AMER CHEMICAL SOC
Article

A carrier transport model in the high-resistance state of lead-methylamine iodide-based resistive memory devices

  • 2017-08
  • AIP Advances
  • AMER INST PHYSICS
Article

Modeling of Grain Growth in the Polysilicon Channel Process of a Vertical NAND Flash Memory

  • 2017-04
  • Journal of Nanoelectronics and Optoelectronics
  • AMER SCIENTIFIC PUBLISHERS
2016
Article

Impact of contact resistance on memory window in phase-change random access memory (PCRAM)

  • An, Jun-seop ; 
  • Choi, Chul-min ; 
  • Shindo, Satoshi ; 
  • Sutou, Yuji ; 
  • Kwon, Yong-woo ; 
  • 외 1명
  • 2016-12
  • Journal of Computational Electronics
  • SPRINGER
Article

Modeling of data retention statistics of phase-change memory with confined- and mushroom-type cells

  • 2016-08
  • Microelectronics and Reliability
  • PERGAMON-ELSEVIER SCIENCE LTD
Article

Enhanced fluorescent stability of copper indium sulfide quantum dots through incorporating aluminum into ZnS shell

  • 2016-03-25
  • Journal of Alloys and Compounds
  • ELSEVIER SCIENCE SA
2015
Article

Simulation of Honeycomb-Structured SiC Heating Elements

  • Lee, Jong-Hyuk ; 
  • Cho, Youngjae ; 
  • Kim, Chanyoung ; 
  • Kwon, Yongwoo ; 
  • Kong, Young-Min
  • 2015-09
  • 한국재료학회지
  • MATERIALS RESEARCH SOC KOREA
Article

Mechanism of Metal Nanowire Formation via the Polyol Process

  • Choi, Yo-Han ; 
  • Chae, Young-Soo ; 
  • Lee, Jong-Hyuk ; 
  • Kwon, Yong-woo ; 
  • Kim, Yong-Seog
  • 2015-09
  • Electronic Materials Letters
  • KOREAN INST METALS MATERIALS
Article

Scaling of Data Retention Statistics in Phase-Change Random Access Memory

  • 2015-05
  • IEEE Electron Device Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC