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김형탁 프로필 사진

김형탁

Kim, Hyung tak

공과대학

전자전기공학부

연도별 연구 활동 현황

전체 87건 중 61번부터 70번까지의 결과를 표시합니다.

2015

Article

Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors

Article

Reduction of Spurious Tones and Phase Noise in Dual-Loop OEO by Loop-Gain Control

Article

Extraction of the interface trap density through the differential subthreshold ideality factor technique in normally-off AlGaN/GaN MOSHFETs

Article

Untitled

2014

Article

AlGaN/GaN MOSHFET Power Switching Transistor with Embedded Fast Recovery Diode

Article

Temperature-Dependent Instabilities of DC characteristics in AlGaN/GaN-on-Si Heterojunction Field Effect Transistors

Article

Development of a Au-free process using Mo-based metallization for high-power AlGaN/GaN-on-Si heterostructure field-effect transistors

2013

Article

Simple Dual-loop Optoelectronic Oscillator with a Low Spurious Level

Article

A Reset-Free Anti-Harmonic Programmable MDLL-Based Frequency Multiplier

Article

Degradation characteristics of high-voltage AlGaN/GaN-on-Si heterostructure FETs under a reverse gate bias stress

상세 보기

김형탁

자료유형

발행연도

키워드

언어

Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors

Reduction of Spurious Tones and Phase Noise in Dual-Loop OEO by Loop-Gain Control

Extraction of the interface trap density through the differential subthreshold ideality factor technique in normally-off AlGaN/GaN MOSHFETs

Untitled

AlGaN/GaN MOSHFET Power Switching Transistor with Embedded Fast Recovery Diode

Temperature-Dependent Instabilities of DC characteristics in AlGaN/GaN-on-Si Heterojunction Field Effect Transistors

Development of a Au-free process using Mo-based metallization for high-power AlGaN/GaN-on-Si heterostructure field-effect transistors

Simple Dual-loop Optoelectronic Oscillator with a Low Spurious Level

A Reset-Free Anti-Harmonic Programmable MDLL-Based Frequency Multiplier

Degradation characteristics of high-voltage AlGaN/GaN-on-Si heterostructure FETs under a reverse gate bias stress