차호영 프로필 사진

차호영

Cha, Ho Young

공과대학

전자전기공학부

자료 필터

자료유형

발행연도

2008 ~ 2026
2008 2026

키워드

언어

전체 158건 중 61번부터 70번까지의 결과를 표시합니다.

2018
Article

Investigation of Defect Distributions in SiO2/AlGaN/GaN High-Electron-Mobility Transistors by Using Capacitance-Voltage Measurement with Resonant Optical Excitation

  • Kim, Tae-Soo ; 
  • Lim, Seung-Young ; 
  • Park, Yong-Keun ; 
  • Jung, Gunwoo ; 
  • Song, Jung-Hoon ; 
  • ... Cha, Ho-Young ; 
  • 외 1명
  • 2018-06
  • Journal of the Korean Physical Society
  • KOREAN PHYSICAL SOC
Article

High-Performance E-Mode AlGaN/GaN MIS-HEMT with Dual Gate Insulator Employing SiON and HfON

  • Hwang, Il-Hwan ; 
  • Eom, Su-Keun ; 
  • Choi, Gwang-Ho ; 
  • Kang, Myoung-Jin ; 
  • Lee, Jae-Gil ; 
  • ... Cha, Ho-Young ; 
  • 외 1명
  • 2018-05-23
  • physica status solidi (a) - applications and materials science
  • WILEY-V C H VERLAG GMBH
Article

Analysis of Defect-Related Electrical Fatigue in 4H-SiC Avalanche Photodiodes

  • Chong, E. ; 
  • Park, B. -H. ; 
  • Cha, H. -Y. ; 
  • Choi, K-K. ; 
  • Lee, D. -H.
  • 2018-05-15
  • IEEE Photonics Technology Letters
  • IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article

Diode quenching for Geiger mode avalanche photodiode

  • 2018-05-10
  • IEICE Electronics Express
  • IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG
Article

Enhanced UV absorption of GaN photodiodes with a ZnO quantum dot coating layer

  • 2018-04-02
  • Optics Express
  • OPTICAL SOC AMER
Article

Effects of PECVD SiO2 Gate Dielectric Thickness on Recessed AlGaN/GaN MOS-HFETs

  • 2018-04
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

Parasitic Resistance Effects on Mobility Extraction of Normally-off AlGaN/GaN Gate-recessed MISHFETs

  • 2018-02
  • JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
  • IEEK PUBLICATION CENTER
Article

Epitaxial ZnO gate dielectrics deposited by RF sputter for AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors

  • Yoon, Seonno ; 
  • Lee, Seungmin ; 
  • Kim, Hyun-Seop ; 
  • Cha, Ho-Young ; 
  • Lee, Hi-Deok ; 
  • 외 1명
  • 2018-01
  • Semiconductor Science and Technology
  • IOP PUBLISHING LTD
Article

Improved interface characteristics of Mo/SiO2/4H-SiC metal-oxide-semiconductor with post-metallization annealing

  • Lee, Jae-Gil ; 
  • Kim, Dong-Hwan ; 
  • Eom, Su-Keun ; 
  • Roh, Seung-Hyun ; 
  • Seo, Kwang-Seok ; 
  • ... Kim, Hyungtak ; 
  • ... Cha, Ho-Young ; 
  • 외 2명
  • 2018-01
  • Journal of the Korean Physical Society
  • KOREAN PHYSICAL SOC